3633195

Transmission line pulse testing (TLP) ideas and applications

Natarajan Mahadeva Iyer

IMEC, Belgium

2002

1

1

"Transmission lines","Semiconductor device testing","System testing","Robustness","Semiconductor devices","Materials reliability","Dielectric devices","Materials testing","System performance"

ieee

2002 Electrical Overstress/Electrostatic Discharge Symposium, 2002. EOS/ESD ´02.

conf

5266988