Title :
Sensitivity of threshold crossing time to geometrical dimensions of VLSI interconnects
Author :
Agnieszka Ligocka-Wardzinska;Wojciech Bandurski
Author_Institution :
Multimedia Telecommunications and Microelectronics, Poznan University of Technology, Poland
Abstract :
The paper presents a sensitivity analysis of threshold crossing time for the step and ramp response of VLSI interconnects to geometrical dimensions of microstrip model of higher level interconnects. The method is based on threshold crossing time obtained for analytical form of VLSI output response calculated using multiple scales method.
Keywords :
"Very large scale integration","Integrated circuit interconnections","Integrated circuit modeling","Sensitivity analysis","Delay","Inductance","Transmission line theory","Voltage","Capacitance","Equations"
Conference_Titel :
Mixed Design of Integrated Circuits & Systems, 2009. MIXDES ´09. MIXDES-16th International Conference
Print_ISBN :
978-1-4244-4798-5
