DocumentCode :
36337
Title :
Complete and Compact 32-Channel System for Time-Correlated Single-Photon Counting Measurements
Author :
Cuccato, A. ; Antonioli, S. ; Crotti, Matteo ; Labanca, I. ; Gulinatti, Angelo ; Rech, Ivan ; Ghioni, Massimo
Author_Institution :
Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
Volume :
5
Issue :
5
fYear :
2013
fDate :
Oct. 2013
Firstpage :
6801514
Lastpage :
6801514
Abstract :
Single-photon detectors play a key role in many research fields such as biology, chemistry, medicine, and space technology, and in recent years, single-photon avalanche diodes (SPADs) have become a valid alternative to photo multiplier tubes (PMTs). Moreover, scientific research has recently focused on single-photon detector arrays, pushed by a growing demand for multichannel systems. In this scenario, we developed a compact 32-channel system for time-resolved single-photon counting applications. The system is divided into two independent modules: a photon detection head including a 32 × 1 SPAD array built in custom technology, featuring high time resolution, high photon detection efficiency (44% at 550 nm), and low dark count rate (mean value <; 400 cps at -10 °C) at 6-V excess bias voltage and a 32-channel acquisition system able to perform time-correlated single-photon counting (TCSPC) measurements. The TCSPC module includes eight four-channel time-to-amplitude converter (TAC) arrays, built-in 0.35-μm Si-Ge BiCMOS technology, characterized by low differential non-linearity (rms value lower than 0.15% of the time bin width) and variable full-scale range. The system response function of this TCSPC instrumentation achieves a mean time resolution of 63 psFWHM, considering a mean count rate of 1 Mcps.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; avalanche photodiodes; integrated optoelectronics; optical arrays; photodetectors; photon counting; SPAD array; Si-Ge; Si-Ge BiCMOS technology; TAC arrays; TCSPC module; compact 32-channel acquisition system; dark count rate; differential nonlinearity; excess bias voltage; four-channel time-to-amplitude converter arrays; mean count rate; mean time resolution; multichannel systems; photon detection efficiency; photon detection head; rms value; single-photon avalanche diodes; single-photon detector arrays; size 0.35 mum; system response function; temperature -10 degC; time bin width; time-correlated single-photon counting measurements; time-resolved single-photon counting; voltage 6 V; wavelength 550 nm; Crosstalk; Detectors; Fluorescence; Periodic structures; Photonics; Temperature control; Temperature measurement; Single-photon avalanche diode (SPAD) array; time-correlated single-photon counting (TSPC); time-to-amplitude converter (TAC); time-to-digital converter (TDC);
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2013.2284250
Filename :
6617673
Link To Document :
بازگشت