Title :
Non-robust versus robust [test generation]
Author :
A. Pierzynska;S. Pilarski
Author_Institution :
Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Abstract :
We show that a path delay under a non-robust test may be longer than under any robust test. Thus, for a given path, a non-robust test can detect a delay fault undetectable by robust tests. This can happen even in a circuit in which all paths are robust-testable.
Keywords :
"Robustness","Circuit testing","Circuit faults","Electrical fault detection","Fault detection","Logic testing","Logic circuits","Propagation delay","Combinational circuits","Councils"
Conference_Titel :
Test Conference, 1995. Proceedings., International
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529825