DocumentCode
3633880
Title
An oscilloscope array for high-impedance device characterization
Author
Fred Chen;Anantha Chandrakasan;Vladimir Stojanovic
Author_Institution
Department of Electrical Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA
fYear
2009
Firstpage
112
Lastpage
115
Abstract
An equivalent time oscilloscope array is implemented in a 90nm CMOS technology. A combination of adjustable termination, calibration circuitry and capacitance compensation enables driver bandwidths between 0.4 to 2GHz for termination impedances of 20Ω to 2kΩ for extraction of S-parameters and delay characteristics of high impedance devices such as carbon nanotubes (CNTs) and graphene. Measurement results show that the capacitance compensation technique enhances the bandwidth by 3X for impedances between 2kΩ and 20kΩ.
Keywords
"Oscilloscopes","Impedance","CMOS technology","Capacitance","Bandwidth","Calibration","Driver circuits","Scattering parameters","Delay","Carbon nanotubes"
Publisher
ieee
Conference_Titel
ESSCIRC, 2009. ESSCIRC ´09. Proceedings of
ISSN
1930-8833
Print_ISBN
978-1-4244-4355-0;978-1-4244-4354-3
Type
conf
DOI
10.1109/ESSCIRC.2009.5325935
Filename
5325935
Link To Document