Title :
Charge injection induced sample and hold error analysis
Author :
Andrei Danchiv;Mircea Bodea;Ana-Maria Luca;Ioan-Alexandru Tranca
Author_Institution :
Infineon Technologies Romania, Blvd. Dimitrie Pompeiu nr. 6, Bucharest, Romania
Abstract :
This paper analysis the charge injection induced error in CMOS switched capacitor circuits. For this purpose, the basic S/H topology is used and an on-off transition model is considered, for both n and p channel switches. The transient error voltage behavior is presented. The final error value dependence on circuit parameters is analyzed and compared with simulation results.
Keywords :
"Error analysis","Switches","Voltage","Capacitance","MOS capacitors","Character generation","Equations","Switched capacitor circuits","Circuit topology","Circuit analysis"
Conference_Titel :
Semiconductor Conference, 2009. CAS 2009. International
Print_ISBN :
978-1-4244-4413-7
Electronic_ISBN :
2377-0678
DOI :
10.1109/SMICND.2009.5336668
