Title :
Can be diode laser emission characterized by high resolution FT spectrometry?
Author_Institution :
J. Heyrovsky Institute of Physical Chemistry, Academy of Sciences of the Czech Republic v.v.i., Dolejskova 3, 182 23 Prague 8, Czech Republic
Abstract :
The main target of this work is focused on characterization and measurement of the basic properties of laser emission (laser width) of several VCSEL diode based on GaSb matrix, which are emitting in the infrared region around 4250 cm-1. High resolution Fourier transform Bruker IFS 120 HR spectrometer with maximum resolution 0.003 cm-1 was used for the laser diagnostic research.
Keywords :
"Diode lasers","Spectroscopy","Vertical cavity surface emitting lasers","Gas lasers","Surface emitting lasers","Ring lasers","Semiconductor lasers","Electromagnetic wave absorption","Infrared detectors","Monitoring"
Conference_Titel :
ICTON Mediterranean Winter Conference,2009. ICTON-MW 2009. 3rd
Print_ISBN :
978-1-4244-5745-8
DOI :
10.1109/ICTONMW.2009.5385572
