• DocumentCode
    3634675
  • Title

    Can be diode laser emission characterized by high resolution FT spectrometry?

  • Author

    Svatopluk Civiš

  • Author_Institution
    J. Heyrovsky Institute of Physical Chemistry, Academy of Sciences of the Czech Republic v.v.i., Dolejskova 3, 182 23 Prague 8, Czech Republic
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The main target of this work is focused on characterization and measurement of the basic properties of laser emission (laser width) of several VCSEL diode based on GaSb matrix, which are emitting in the infrared region around 4250 cm-1. High resolution Fourier transform Bruker IFS 120 HR spectrometer with maximum resolution 0.003 cm-1 was used for the laser diagnostic research.
  • Keywords
    "Diode lasers","Spectroscopy","Vertical cavity surface emitting lasers","Gas lasers","Surface emitting lasers","Ring lasers","Semiconductor lasers","Electromagnetic wave absorption","Infrared detectors","Monitoring"
  • Publisher
    ieee
  • Conference_Titel
    ICTON Mediterranean Winter Conference,2009. ICTON-MW 2009. 3rd
  • Print_ISBN
    978-1-4244-5745-8
  • Type

    conf

  • DOI
    10.1109/ICTONMW.2009.5385572
  • Filename
    5385572
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3634675