Temperature dependent photoluminescence process in ZnO thin films grown on quartz by sol-gel method

The optical properties of ZnO thin films grown by sol-gel method on quartz wafers were studied using photoluminescence measurements for optical properties. The structural properties of the ZnO thin films were carried out using X-ray method. The effects of the thickness variation and annealing temperature on the crystallinity parameters were observed. A strong dependence of the films structure, the crystalline quality and the optical properties was also observed.