Title :
Selective Epitaxial Bipolar Technology for 25 to 40 Gb/s ICs
Author :
T.F. Meister;R. Stengl;A. Felder;H.-M. Rein;L. Treitinger
Author_Institution :
SIEMENS AG, Corporate Research and Development, Microelectronics, Otto-Hahn-Ring 6, 8000 Munich 83, GERMANY
Abstract :
A silicon bipolar technology, which uses Selective Epitaxial Growth (SEG) for the active base and collector regions is described. Key features of the SEG transistor configuration are a quasi self-aligned base/collector structure and an epitaxial base process, which has been integrated into a self-aligned double-poly emitter/base configuration. The high speed capability of the SEG transistor concept has been proven by CML gate delay times of 18 ps. In addition several ICs (2:1 static frequency divider, time division multiplexer, demultiplexer) suited for optical-fibre links and measurement equipment have been fabricated.
Keywords :
"Cutoff frequency","Epitaxial growth","Silicon","Multiplexing","Doping profiles","Tunneling","Circuit optimization","Parasitic capacitance","Paper technology","Research and development"
Conference_Titel :
Solid State Device Research Conference, 1993. ESSDERC ´93. 23rd European
Print_ISBN :
2-86332-135-8