• DocumentCode
    3635143
  • Title

    Selective Epitaxial Bipolar Technology for 25 to 40 Gb/s ICs

  • Author

    T.F. Meister;R. Stengl;A. Felder;H.-M. Rein;L. Treitinger

  • Author_Institution
    SIEMENS AG, Corporate Research and Development, Microelectronics, Otto-Hahn-Ring 6, 8000 Munich 83, GERMANY
  • fYear
    1993
  • Firstpage
    203
  • Lastpage
    210
  • Abstract
    A silicon bipolar technology, which uses Selective Epitaxial Growth (SEG) for the active base and collector regions is described. Key features of the SEG transistor configuration are a quasi self-aligned base/collector structure and an epitaxial base process, which has been integrated into a self-aligned double-poly emitter/base configuration. The high speed capability of the SEG transistor concept has been proven by CML gate delay times of 18 ps. In addition several ICs (2:1 static frequency divider, time division multiplexer, demultiplexer) suited for optical-fibre links and measurement equipment have been fabricated.
  • Keywords
    "Cutoff frequency","Epitaxial growth","Silicon","Multiplexing","Doping profiles","Tunneling","Circuit optimization","Parasitic capacitance","Paper technology","Research and development"
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1993. ESSDERC ´93. 23rd European
  • Print_ISBN
    2-86332-135-8
  • Type

    conf

  • Filename
    5435492