• DocumentCode
    3635188
  • Title

    CPU Testability in Embedded Systems

  • Author

    Janusz Sosnowski;Lukasz Tupaj

  • Author_Institution
    Inst. of Comput. Sci., Warsaw Univ. of Technol., Warsaw, Poland
  • fYear
    2010
  • Firstpage
    108
  • Lastpage
    112
  • Abstract
    The paper deals with the problem of testing CPUs in embedded systems taking into account application properties. Basing on the developed original software tools we have analysed the coverage of CPU functionality and operational stresses for many benchmark programs. The experimental results confirmed the need of introducing application driven testing of CPUs to assure high fault coverage with acceptable software and time overheads. This original approach has been used in some real systems.
  • Keywords
    "System testing","Embedded system","Circuit testing","Software testing","Application software","Built-in self-test","Microprocessors","Central Processing Unit","Design for testability","Hardware"
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Application, 2010. DELTA ´10. Fifth IEEE International Symposium on
  • Print_ISBN
    978-1-4244-6025-0;978-0-7695-3978-2
  • Type

    conf

  • DOI
    10.1109/DELTA.2010.33
  • Filename
    5438704
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3635188