Title :
Pseudorandom versus deterministic testing of Intel 80/spl times/86 processors
Author :
J. Sosnowski;A. Kusmierczyk
Author_Institution :
Inst. of Comput. Sci., Warsaw Univ. of Technol., Poland
Abstract :
The paper deals with the problem of testing microprocessors in the system environment. We discuss two approaches to testing microprocessors: deterministic and pseudorandom. They are related to Intel 80/spl times/86 processors. Many drawbacks of the deterministic approach can be overcome with pseudorandom tests. However developing pseudorandom test programs we face some other problems. The paper shows how to combine the two approaches.
Keywords :
"Circuit testing","Circuit faults","Microprocessors","Logic testing","Adders","System testing","Built-in self-test","Data processing","Computer science","Registers"
Conference_Titel :
EUROMICRO 96. Beyond 2000: Hardware and Software Design Strategies., Proceedings of the 22nd EUROMICRO Conference
Print_ISBN :
0-8186-7487-3
DOI :
10.1109/EURMIC.1996.546398
