• DocumentCode
    3635431
  • Title

    Intercomparison of silicon samples from the Avogadro project

  • Author

    E.G. Kessler;J.E. Schweppe;R.D. Deslattes

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    1996
  • Firstpage
    159
  • Lastpage
    160
  • Abstract
    The NIST lattice comparator currently assesses lattice parameter differences among carefully prepared samples of monocrystalline silicon with a level of imprecision near 10/sup -8/. This instrument has recently been used to effect intercomparisons among samples from laboratories currently engaged in direct optical measurements of such lattice period. Results reported here assist in global estimates of the current state of the art of these determinations.
  • Keywords
    "Silicon","Lattices","NIST","Laboratories","Current measurement","Spectroscopy","Instruments","Optical sensors","Geometry","X-ray detection"
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1996 Conference on
  • Print_ISBN
    0-7803-3376-4
  • Type

    conf

  • DOI
    10.1109/CPEM.1996.546668
  • Filename
    546668
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3635431