DocumentCode :
3635951
Title :
Switching losses of IGBTs under zero-voltage and zero-current switching
Author :
A. Elasser;M.J. Schutten;V. Vlatkovic;D.A. Torrey;M.H. Kheraluwala
Author_Institution :
Dept. of Electr. Power Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
1
fYear :
1996
Firstpage :
600
Abstract :
Turn-off switching losses of punch-through (PT) and nonpunch-through (NPT) IGBTs under hard switching (HS) and zero-voltage switching (ZVS) are presented and evaluated at 25/spl deg/C, 75/spl deg/C and 125/spl deg/C. A comparison between PT and NPT devices based on their internal device characteristics is given for HS and ZVS. The low emitter efficiency NPT IGBTs used in this paper have smaller switching losses under HS and ZVS at 125/spl deg/C than PT devices. Zero-current switching (ZCS) techniques are also evaluated for both IGBT structures. PT IGBTs are found to have lower turn-off losses than NPT IGBTs.
Keywords :
"Switching loss","Insulated gate bipolar transistors","Zero current switching","Zero voltage switching","Switches","Tail","Circuits","Clamps","Temperature sensors","Inductors"
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 1996. PESC ´96 Record., 27th Annual IEEE
ISSN :
0275-9306
Print_ISBN :
0-7803-3500-7
Type :
conf
DOI :
10.1109/PESC.1996.548642
Filename :
548642
Link To Document :
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