• DocumentCode
    3635951
  • Title

    Switching losses of IGBTs under zero-voltage and zero-current switching

  • Author

    A. Elasser;M.J. Schutten;V. Vlatkovic;D.A. Torrey;M.H. Kheraluwala

  • Author_Institution
    Dept. of Electr. Power Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    1
  • fYear
    1996
  • Firstpage
    600
  • Abstract
    Turn-off switching losses of punch-through (PT) and nonpunch-through (NPT) IGBTs under hard switching (HS) and zero-voltage switching (ZVS) are presented and evaluated at 25/spl deg/C, 75/spl deg/C and 125/spl deg/C. A comparison between PT and NPT devices based on their internal device characteristics is given for HS and ZVS. The low emitter efficiency NPT IGBTs used in this paper have smaller switching losses under HS and ZVS at 125/spl deg/C than PT devices. Zero-current switching (ZCS) techniques are also evaluated for both IGBT structures. PT IGBTs are found to have lower turn-off losses than NPT IGBTs.
  • Keywords
    "Switching loss","Insulated gate bipolar transistors","Zero current switching","Zero voltage switching","Switches","Tail","Circuits","Clamps","Temperature sensors","Inductors"
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1996. PESC ´96 Record., 27th Annual IEEE
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-3500-7
  • Type

    conf

  • DOI
    10.1109/PESC.1996.548642
  • Filename
    548642