DocumentCode :
3636079
Title :
Sputtering of ZnO:Ga thin films with the inclined crystalic texture
Author :
V. Tvaro?ek;I. Novotn?;P. ?utta;M. Netrvalov?;S. Flickyngerov?;L. Spiess;P. Schaaf
Author_Institution :
Department of Microelectronics, Slovak University of Technology, Ilkovicova 3, 812 19 Bratislava, Slovakia
fYear :
2010
fDate :
5/1/2010 12:00:00 AM
Firstpage :
177
Lastpage :
180
Abstract :
In this paper the possibility to form thin films with the inclined crystalic texture by the RF diode sputtering is presented. Two oblique deposition arrangements were used for the preparation of ZnO:Ga thin films with the deviation of their columnar structures in the range of 12 ÷ 15 deg to the substrate normal, i.e. an inclination of their ordinary optical axis. The inclined texture of films has changed their optical transmittance spectra as well as it caused the blue-shift and the change of the optical band-gap.
Keywords :
"Sputtering","Optical films","Optical scattering","Optical sensors","Substrates","Photonic band gap","Photovoltaic cells","Optical surface waves","Light scattering","Electromagnetic wave absorption"
Publisher :
ieee
Conference_Titel :
Microelectronics Proceedings (MIEL), 2010 27th International Conference on
Print_ISBN :
978-1-4244-7200-0
Type :
conf
DOI :
10.1109/MIEL.2010.5490506
Filename :
5490506
Link To Document :
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