Title :
On p-n junction depletion capacitance parameter extraction strategies
Author :
Vladimir Milovanović;Ramses van der Toorn
Author_Institution :
Delft Institute of Microsystems and Nanoelectronics (DIMES), Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technology (TU Delft), Mekelweg 4, 2628CD Delft, Netherlands
fDate :
5/1/2010 12:00:00 AM
Abstract :
Two strategies for extraction of p-n junction´s depletion capacitance compact model parameters are identified and compared by the present paper. Applying these in a numerical experiment and device measurements, it is demonstrated that the reproducibility of the estimated parameter values can strongly depend on the extraction strategy applied within the nonlinear regression procedure. An approach to assess statistical properties of parameter extraction strategies is presented and the merits of such assessments are shown.
Keywords :
"P-n junctions","Capacitance","Parameter extraction","Temperature sensors","Temperature dependence","Parameter estimation","Space charge","Diodes","Integrated circuit modeling","Temperature distribution"
Conference_Titel :
Microelectronics Proceedings (MIEL), 2010 27th International Conference on
Print_ISBN :
978-1-4244-7200-0
DOI :
10.1109/MIEL.2010.5490528
