• DocumentCode
    3636084
  • Title

    On p-n junction depletion capacitance parameter extraction strategies

  • Author

    Vladimir Milovanović;Ramses van der Toorn

  • Author_Institution
    Delft Institute of Microsystems and Nanoelectronics (DIMES), Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technology (TU Delft), Mekelweg 4, 2628CD Delft, Netherlands
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    87
  • Lastpage
    90
  • Abstract
    Two strategies for extraction of p-n junction´s depletion capacitance compact model parameters are identified and compared by the present paper. Applying these in a numerical experiment and device measurements, it is demonstrated that the reproducibility of the estimated parameter values can strongly depend on the extraction strategy applied within the nonlinear regression procedure. An approach to assess statistical properties of parameter extraction strategies is presented and the merits of such assessments are shown.
  • Keywords
    "P-n junctions","Capacitance","Parameter extraction","Temperature sensors","Temperature dependence","Parameter estimation","Space charge","Diodes","Integrated circuit modeling","Temperature distribution"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics Proceedings (MIEL), 2010 27th International Conference on
  • Print_ISBN
    978-1-4244-7200-0
  • Type

    conf

  • DOI
    10.1109/MIEL.2010.5490528
  • Filename
    5490528
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3636084