Test generation for technology-specific faults in multi-output combinational modules

In this paper the test generation method for technology specific faults in multi-output combinational modules is introduced. The method is based on the concept of detectable perturbations to generate tests that can then cover any technology-specific faults such as multiple bridging, open and stuck-at faults. Rather than devising a customized test pattern generation system for each class of technology-specific faults, we implemented a generic system to generate tests for single and multiple perturbations. Experimental results provide useful insights about the quality of single stuck-at test patterns versus additional classes of faults.