DocumentCode :
3637325
Title :
Investigations of temperature dependent photoluminescence process in MgO thin films
Author :
A. Zawadzka;P. Płóciennik;K. Brodzińska;Z. Łukasiak;K. Bartkiewicz;A. Korcala
Author_Institution :
Institute of Physics, N. Copernicus University, Grudzią
fYear :
2010
Firstpage :
1
Lastpage :
2
Abstract :
Pulsed laser deposition (PLD) technique (called also laser ablation) has been employed to grow magnesium oxide thin films on quartz wafers. The optical properties of MgO thin films were studied using temperature dependent photoluminescence measurements. The structural properties of the MgO thin films were carried out using X-ray method. A strong dependence of the films structure, the crystalline quality and the optical properties of investigated films caused by variation of substrate´s temperature was observed.
Keywords :
"Temperature dependence","Photoluminescence","Transistors","Optical films","Pulsed laser deposition","Laser ablation","X-ray lasers","Temperature measurement","Optical pulses","Magnesium oxide"
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks (ICTON), 2010 12th International Conference on
Print_ISBN :
978-1-4244-7799-9
Type :
conf
DOI :
10.1109/ICTON.2010.5549017
Filename :
5549017
Link To Document :
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