• DocumentCode
    3637325
  • Title

    Investigations of temperature dependent photoluminescence process in MgO thin films

  • Author

    A. Zawadzka;P. Płóciennik;K. Brodzińska;Z. Łukasiak;K. Bartkiewicz;A. Korcala

  • Author_Institution
    Institute of Physics, N. Copernicus University, Grudzią
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Pulsed laser deposition (PLD) technique (called also laser ablation) has been employed to grow magnesium oxide thin films on quartz wafers. The optical properties of MgO thin films were studied using temperature dependent photoluminescence measurements. The structural properties of the MgO thin films were carried out using X-ray method. A strong dependence of the films structure, the crystalline quality and the optical properties of investigated films caused by variation of substrate´s temperature was observed.
  • Keywords
    "Temperature dependence","Photoluminescence","Transistors","Optical films","Pulsed laser deposition","Laser ablation","X-ray lasers","Temperature measurement","Optical pulses","Magnesium oxide"
  • Publisher
    ieee
  • Conference_Titel
    Transparent Optical Networks (ICTON), 2010 12th International Conference on
  • Print_ISBN
    978-1-4244-7799-9
  • Type

    conf

  • DOI
    10.1109/ICTON.2010.5549017
  • Filename
    5549017
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3637325