DocumentCode :
3638117
Title :
FM and QAM signals for ADC testing
Author :
Josef Vedral;Pavel Fexa;Jakub Svatoš
Author_Institution :
CTU in Prague, Faculty of Electrical Engineering, Department of Measurement Technická
fYear :
2010
Firstpage :
1
Lastpage :
4
Abstract :
In this paper the qualities of methods for testing dynamical parameters of A/D converters with analog frequency modulated and quadrature modulated signals are analyzed. Results of test are compared with standard Single-Tone Fourier Transform Test.
Keywords :
"Testing","Frequency shift keying","Quadrature amplitude modulation","Distortion","Noise"
Publisher :
ieee
Conference_Titel :
Applied Electronics (AE), 2010 International Conference on
ISSN :
1803-7232
Print_ISBN :
978-80-7043-865-7
Type :
conf
Filename :
5599600
Link To Document :
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