• DocumentCode
    3638397
  • Title

    High resolution measurements to determine the permittivity in artificial structures

  • Author

    C. Krebs;J. Rubart;A. Hommes;Ralf Brauns;Dirk Nüßler

  • Author_Institution
    RheinAhrCampus Remagen, Department of Mathematics and Technology, Germany
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The characterization of materials is one major task for systems which work e.g. in the field of quality or production control. One factor to analyze material volume information is the permittivity. The following paper describes a measurement method to determine and gives an overview about the measurement system. In addition first measurement results will be shown.
  • Keywords
    "Frequency measurement","Permittivity measurement","Materials","Permittivity","Dielectrics","Optical sensors"
  • Publisher
    ieee
  • Conference_Titel
    Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
  • ISSN
    2162-2027
  • Print_ISBN
    978-1-4244-6655-9
  • Electronic_ISBN
    2162-2035
  • Type

    conf

  • DOI
    10.1109/ICIMW.2010.5613004
  • Filename
    5613004
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3638397