DocumentCode :
3638919
Title :
Strong Er emission from Er doped SiO2/nc-Si multilayers
Author :
Yijing Fu;Halina. Krzyżanowska;Karl Ni;Joshua LaRose;Mengbing Huang;Philippe M. Fauchet
Author_Institution :
Institute of Optics, University of Rochester, Rochester, NY 14627, USA
fYear :
2010
Firstpage :
305
Lastpage :
307
Abstract :
We demonstrate strong Er emission from Er doped SiO2/nc-Si multilayer structures. Compared to reference samples, Er emission is enhanced and nc-Si emission is quenched, indicating energy transfer is the reason behind this enhancement.
Keywords :
"Erbium","Silicon","Nonhomogeneous media","Ions","Energy exchange","Measurement by laser beam","Temperature measurement"
Publisher :
ieee
Conference_Titel :
Group IV Photonics (GFP), 2010 7th IEEE International Conference on
Print_ISBN :
978-1-4244-6344-2
Type :
conf
DOI :
10.1109/GROUP4.2010.5643344
Filename :
5643344
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3638919
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