Title :
First measurement on the DEPFET Mini-matrix particle detector system
Author :
J. Scheirich;C. Oswald;P. Kodyš
Author_Institution :
Department of Microelectronics, Czech Technical University in Prague, Faculty of Electrical Engineering, Technická
Abstract :
The DEPFET is a new type of active pixel particle detector. A MOSFET is integrated in each pixel providing the first amplification stage of the readout electronics. Excellent noise parameters are obtained with this layout. The DEPFET sensor will be integrated as an inner detector in the BELLE II experiment. A flexible measuring system with a wide control cycle range and minimal noise was designed for testing small detector prototypes. Noise of 19 electrons of the equivalent input charge was achieved during the first measurements on the system.
Keywords :
"Pixel","Logic gates","Detectors","Noise","MOSFET circuits","Current measurement","Data acquisition"
Conference_Titel :
Advanced Semiconductor Devices & Microsystems (ASDAM), 2010 8th International Conference on
Print_ISBN :
978-1-4244-8574-1
DOI :
10.1109/ASDAM.2010.5667004