DocumentCode
3639469
Title
Digital PVT calibration of a Frequency-to-Voltage converter
Author
Jørgen Andreas Michaelsen;Dag T. Wisland
Author_Institution
Nanoelectronics Group, Dept. of Informatics, University of Oslo, PO Box 1080 Blindern, 0316, Norway
fYear
2010
Firstpage
1
Lastpage
4
Abstract
A digital process, voltage, and temperature (PVT) calibration loop for a Frequency-to-Voltage converter (FVC) is presented. The FVC needs a precisely controlled delay element, but delay in CMOS is highly dependent on the PVT condition making it neccessary to calibrate the delay line. The system is designed to calibrate against an external reference frequency which is already present in the intended application. This is advantageous, as it is not neccesary to generate additional bandgap or other reference on chip. Results from transistor level simulations using a 90 nm CMOS process are presented, showing good regulation accross PVT corners and ability to track changes in the PVT condition. The calibration loop is digital and therefore a good fit for CMOS technology.
Keywords
"Impedance","CMOS integrated circuits","CMOS technology","Semiconductor device measurement","Low power electronics","Capacitance","Gain"
Publisher
ieee
Conference_Titel
NORCHIP, 2010
Print_ISBN
978-1-4244-8972-5
Type
conf
DOI
10.1109/NORCHIP.2010.5669455
Filename
5669455
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