• DocumentCode
    3639469
  • Title

    Digital PVT calibration of a Frequency-to-Voltage converter

  • Author

    Jørgen Andreas Michaelsen;Dag T. Wisland

  • Author_Institution
    Nanoelectronics Group, Dept. of Informatics, University of Oslo, PO Box 1080 Blindern, 0316, Norway
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A digital process, voltage, and temperature (PVT) calibration loop for a Frequency-to-Voltage converter (FVC) is presented. The FVC needs a precisely controlled delay element, but delay in CMOS is highly dependent on the PVT condition making it neccessary to calibrate the delay line. The system is designed to calibrate against an external reference frequency which is already present in the intended application. This is advantageous, as it is not neccesary to generate additional bandgap or other reference on chip. Results from transistor level simulations using a 90 nm CMOS process are presented, showing good regulation accross PVT corners and ability to track changes in the PVT condition. The calibration loop is digital and therefore a good fit for CMOS technology.
  • Keywords
    "Impedance","CMOS integrated circuits","CMOS technology","Semiconductor device measurement","Low power electronics","Capacitance","Gain"
  • Publisher
    ieee
  • Conference_Titel
    NORCHIP, 2010
  • Print_ISBN
    978-1-4244-8972-5
  • Type

    conf

  • DOI
    10.1109/NORCHIP.2010.5669455
  • Filename
    5669455