DocumentCode
3640484
Title
Parametric Yield Optimization Of MOS Vlsi Circuits Based On Simulated Annealing
Author
M. Angeli;M. Conti;C. Turchetti
fYear
1992
fDate
6/14/1905 12:00:00 AM
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Print_ISBN
0-7803-0246-X
Type
conf
DOI
10.1109/CICC.1992.591102
Filename
5727280
Link To Document