DocumentCode :
3640550
Title :
Fault Model Evolution For Diagnosis: Accuracy vs Precision
Author :
J.M. Acken;S.D. Millman
fYear :
1992
fDate :
6/14/1905 12:00:00 AM
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Print_ISBN :
0-7803-0246-X
Type :
conf
DOI :
10.1109/CICC.1992.591298
Filename :
5727346
Link To Document :
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