مرکز منطقه ای اطلاع رساني علوم و فناوري - Layout Analysis And Automatic Test Point Selection For Fast Prototype Debug Using E-beam Or Laser-beam Testsystems

DocumentCode :

3640578

Title :

Layout Analysis And Automatic Test Point Selection For Fast Prototype Debug Using E-beam Or Laser-beam Testsystems

Author :

R. Scharf;C. Kuntzsch;K. Helmreich;W. Wolz;K.D. MuIler-GIaser

fYear :

1992

fDate :

6/14/1905 12:00:00 AM

Publisher :

ieee

Conference_Titel :

Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992

Print_ISBN :

0-7803-0246-X

Type :

conf

DOI :

10.1109/CICC.1992.591326

Filename :

5727374

Link To Document :