DocumentCode
3640581
Title
An Accurate Approach To Simulating The Hot Carrier Reliability Of MOS IC´s Under AC Stress
Author
S.S. Chung;P.-C. Hsu;J.-S. Lee
fYear
1992
fDate
6/14/1905 12:00:00 AM
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Print_ISBN
0-7803-0246-X
Type
conf
DOI
10.1109/CICC.1992.591330
Filename
5727378
Link To Document