Title :
The Degree of Masking Fault Tolerance vs. Temporal Redundancy
Author :
Nils Müllner;Oliver Theel
Author_Institution :
Dept. of Comput. Sci., Carl von Ossietzky Univ. Oldenburg, Oldenburg, Germany
fDate :
3/1/2011 12:00:00 AM
Abstract :
Self-stabilizing systems, intended to run for a long time, commonly have to cope with transient faults during their mission. We model the behavior of a distributed self-stabilizing system under such a fault model as a Markov chain. Adding fault detection to a self-correcting non-masking fault tolerant system is required to progress from non-masking systems towards their masking fault tolerant functional equivalents. We introduce a novel measure, called limiting window availability (LWA) and apply it on self-stabilizing systems in order to quantify the probability of (masked) stabilization against the time that is needed for stabilization. We show how to calculate LWA based on Markov chains: first, by a straightforward Markov chain modeling and second, by using a suitable abstraction resulting in a space-reduced Markov chain. The proposed abstraction can in particular be applied to spot fault tolerance bottlenecks in the system design.
Keywords :
"Markov processes","Availability","Limiting","Fault tolerant systems","Registers","Redundancy"
Conference_Titel :
Advanced Information Networking and Applications (WAINA), 2011 IEEE Workshops of International Conference on
Print_ISBN :
978-1-61284-829-7
DOI :
10.1109/WAINA.2011.137