DocumentCode

3641145

Title

The Harvey Rosten Award

fYear

2011

fDate

3/1/2011 12:00:00 AM

Publisher

ieee

Conference_Titel

Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE

ISSN

1065-2221

Print_ISBN

978-1-61284-740-5

Type

conf

DOI

10.1109/STHERM.2011.5767166

Filename

5767166