• DocumentCode
    3641985
  • Title

    SiC JFET switching behavior in a drive inverter under influence of circuit parasitics

  • Author

    I. Josifović;J. Popović-Gerber;J. A. Ferreira

  • Author_Institution
    Delft University of Technology, Mekelweg 4, 2628CD Delft, The Netherlands
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    1087
  • Lastpage
    1094
  • Abstract
    This paper investigates the switching behaviour of normally-off SiC JFETs in an inverter for a motor drive. The parasitic ringing caused by different parasitic effects is analysed. Two different methods, the use of an RC snubber and the use of a ferrite bead, are proposed for dampening the parasitic oscillations. It is found that applying a ferrite bead not only dampens the parasitic oscillations but also results in significantly lower switching losses. Furthermore, it is shown that the capacitive coupling between SiC devices and heat sinks significantly deteriorates the JFETs´ switching performance. The effect of two substrates, an IMS and a PCB, on the capacitive coupling is investigated. A method in which the use of two separate heat sinks minimises the capacitive coupling thus exploiting the full potential of fast SiC JFETs is proposed.
  • Keywords
    "Logic gates","Silicon carbide","JFETs","Switches","Driver circuits","Ferrites","Oscillators"
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
  • ISSN
    2150-6078
  • Print_ISBN
    978-1-61284-958-4
  • Electronic_ISBN
    2150-6086
  • Type

    conf

  • DOI
    10.1109/ICPE.2011.5944659
  • Filename
    5944659