DocumentCode :
3641985
Title :
SiC JFET switching behavior in a drive inverter under influence of circuit parasitics
Author :
I. Josifović;J. Popović-Gerber;J. A. Ferreira
Author_Institution :
Delft University of Technology, Mekelweg 4, 2628CD Delft, The Netherlands
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1087
Lastpage :
1094
Abstract :
This paper investigates the switching behaviour of normally-off SiC JFETs in an inverter for a motor drive. The parasitic ringing caused by different parasitic effects is analysed. Two different methods, the use of an RC snubber and the use of a ferrite bead, are proposed for dampening the parasitic oscillations. It is found that applying a ferrite bead not only dampens the parasitic oscillations but also results in significantly lower switching losses. Furthermore, it is shown that the capacitive coupling between SiC devices and heat sinks significantly deteriorates the JFETs´ switching performance. The effect of two substrates, an IMS and a PCB, on the capacitive coupling is investigated. A method in which the use of two separate heat sinks minimises the capacitive coupling thus exploiting the full potential of fast SiC JFETs is proposed.
Keywords :
"Logic gates","Silicon carbide","JFETs","Switches","Driver circuits","Ferrites","Oscillators"
Publisher :
ieee
Conference_Titel :
Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
ISSN :
2150-6078
Print_ISBN :
978-1-61284-958-4
Electronic_ISBN :
2150-6086
Type :
conf
DOI :
10.1109/ICPE.2011.5944659
Filename :
5944659
Link To Document :
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