DocumentCode :
3642212
Title :
Terahertz spectroscopy with focused beams: Gouy shift correction for highly accurate refractive index retrieval
Author :
C. Kadlec;H. Němec;F. Kadlec;P. Kužel
Author_Institution :
Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1
Lastpage :
2
Abstract :
Terahertz spectroscopic measurements are usually performed in focused beam geometry while the standard extraction procedure of the sample refractive index assumes plane-wave approximation. We demonstrate a new retrieval model for spatially limited Gaussian terahertz beams.
Keywords :
"Refractive index","Approximation methods","Spectroscopy","Time domain analysis","Silicon","Optimized production technology","Adaptive optics"
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Print_ISBN :
978-1-4577-1223-4
Type :
conf
DOI :
10.1364/CLEO_AT.2011.JThB105
Filename :
5950851
Link To Document :
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