Title :
A new field-probing technique for millimeter-wave components
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
fDate :
6/19/1905 12:00:00 AM
Abstract :
A new technique for probing the fields in the vicinity of a millimeter-wave circuit or antenna, using a dielectric waveguide is described. This technique is expected to be particularly useful for frequencies greater than 100 GHz, where effects of manufacturing inaccuracies, and minute material defects may lead to hard-to-trace faults.
Keywords :
"Millimeter wave technology","Probes","Millimeter wave circuits","Frequency","Dielectric materials","Millimeter wave measurements","Rectangular waveguides","Circuit testing","Dielectric measurements","Dielectric substrates"
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.596725
