3642876

Vector Generation For Maximum Instantaneous Current Through Supply Lines For CMOS Circuits

A. Krstic; Kwang-Ting Cheng

University of California

1997

6/19/1905 12:00:00 AM

383

388

"Current supplies","Circuit testing","Automatic test pattern generation","Power supplies","Delay","Switching circuits","Power generation","Upper bound","Permission","Semiconductor device modeling"

ieee

Design Automation Conference, 1997. Proceedings of the 34th

0738-100X

0-7803-4093-0

conf

10.1109/DAC.1997.597177

597177