3642883

Frequency-domain Compatibility In Digital Filter Bist

L. Goodby;A. Orailoglu

HewIett-Packard Company Palo Alto, CA 94304

1997

6/19/1905 12:00:00 AM

540

545

"Digital filters","Built-in self-test","Character generation","Permission","Circuit testing","Automatic testing","System testing","Circuit faults","Semiconductor device testing","Computer science"

ieee

Design Automation Conference, 1997. Proceedings of the 34th

0738-100X

0-7803-4093-0

conf

10.1109/DAC.1997.597206

597206