DocumentCode :
3643204
Title :
Characterization of degradation process in white light nitride-based LEDs by low-frequency noise
Author :
Bronius Saulys;Vilius Palenskis;Jonas Matukas;Sandra Pralgauskaitė;Egle Tylaite
Author_Institution :
Radiophysics Dep., Vilnius University, Sauletekio 9 (III), 10222, Lithuania
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
448
Lastpage :
451
Abstract :
Noise characteristics (optical and electrical fluctuations and cross-correlation factor between two noise signals) of high power nitride-based white light emitting diodes (LEDs) have been investigated for initial samples and after accelerated aging. Different spectrum parts from white LED radiation have been investigated separately. Electrical fluctuations and low frequency optical noise of investigated LEDs distinguish by 1/fα-type spectrum (above 100 Hz shot noise prevails in optical noise). 1/fα-type optical and electrical fluctuations are partly correlated. After accelerated aging optical 1/fα-type noise intensity increased, and cross-correlation factor between blue and red light intensity fluctuation increased, too. Origin of increased 1/fα-type optical noise is defects in the active layer of investigated white LED, and their increase during aging.
Keywords :
"Light emitting diodes","Optical noise","Noise","Fluctuations","Aging","Optical variables measurement","Frequency measurement"
Publisher :
ieee
Conference_Titel :
Noise and Fluctuations (ICNF), 2011 21st International Conference on
Print_ISBN :
978-1-4577-0189-4
Type :
conf
DOI :
10.1109/ICNF.2011.5994366
Filename :
5994366
Link To Document :
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