DocumentCode :
3643839
Title :
VLSI low loss interconnects scattering parameters
Author :
Agnieszka Wardzińska;Wojciech Bandurski
Author_Institution :
Poznan University of Technology, Chair of Multimedia Telecommunication and Microelectronics, Poland
fYear :
2011
Firstpage :
516
Lastpage :
519
Abstract :
The scattering parameters can be powerful description of interconnect parameters. In the paper we present the closed form formulas for the scattering parameters for low loss interconnect. The method bases on multiple scales method and expands the voltage and current in series of losses parameter. The first order approximation calculate the lossless line response. The impact of losses is included in constants of solution of differential equation. The proposed formulas for scattering parameters are compared with exact calculations in frequency domain.
Keywords :
"Scattering parameters","Integrated circuit interconnections","Load modeling","Power transmission lines","Frequency domain analysis","Integrated circuit modeling","Time domain analysis"
Publisher :
ieee
Conference_Titel :
Circuit Theory and Design (ECCTD), 2011 20th European Conference on
Print_ISBN :
978-1-4577-0617-2
Type :
conf
DOI :
10.1109/ECCTD.2011.6043402
Filename :
6043402
Link To Document :
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