Title :
A Framework to Manage Knowledge from Defect Resolution Process
Author :
Gregory Claude;Marc Boyer;Gaël Durand;Florence Sèdes
Author_Institution :
IRIT, Univ. de Toulouse, Toulouse, France
Abstract :
This paper presents a framework for the management, the processing and the reuse, of information relative to defects. This framework is based on the fact that each defect triggers a resolution process in which information about the detected incident (i.e. the problem) and about the applied protocol to resolve it (i.e. the solution) is collected. These different types of information are the cornerstone of the optimization of corrective and preventive processes for new defects. Experimentations show that our prototype provides a very satisfactory quality of results with good performances.
Keywords :
"Maintenance engineering","Prototypes","Manufacturing processes","Databases","Context","Software"
Conference_Titel :
Commerce and Enterprise Computing (CEC), 2011 IEEE 13th Conference on
Print_ISBN :
978-1-4577-1542-6
DOI :
10.1109/CEC.2011.11