DocumentCode :
3644134
Title :
Parameter monitoring of electronic circuits for reliability prediction and failure analysis
Author :
Rajmond Jánó;Dan Pitică
Author_Institution :
Applied Electronics Department, Technical University of Cluj-Napoca, Romania
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
147
Lastpage :
152
Abstract :
As electronic modules are becoming ever more popular in critical safety applications, such as electronic vehicles and aeronautics, so do their operating conditions become harsher. This sometimes means using electronic components at the very limit of their functional parameters and very close to or even exceeding their maximum operating temperature. This of course leads to a dramatic decrease in component lifetimes and classical failure prediction algorithms are thrown off balance, giving unreliable results. This of course means that new prediction methods should be established. The following paper proposes a method for predicting the value of capacitors on the electronic modules, in order to perform real-time prediction of their lifetimes affected by their operational environment. First, two capacitor lifetime models are presented and compared and then the theoretical data are compared with the data obtained from accelerated ageing measurements.
Keywords :
"Capacitors","Temperature measurement","Capacitance","Monitoring","Capacitance measurement","Prediction algorithms","Safety"
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2011 34th International Spring Seminar on
ISSN :
2161-2528
Print_ISBN :
978-1-4577-2111-3
Electronic_ISBN :
2161-2536
Type :
conf
DOI :
10.1109/ISSE.2011.6053568
Filename :
6053568
Link To Document :
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