Title :
Phase evolution of solder alloys
Author :
Alena Pietriková;Juraj Ďurišin
Author_Institution :
Department of Technologies in Electronics, Faculty of Electrical Engineering and Informatics, Technical University of Koš
fDate :
5/1/2011 12:00:00 AM
Abstract :
In-situ X-ray diffraction (XRD) measurements applying synchrotron radiation were realized to evaluate microstructure evolution of 95.5Sn3.8Ag0.7Cu (wt. %), 99Sn1Cu (wt. %) and 96Sn4Ag (wt. %) lead-free solder alloys during heating (30-250°C), isothermal annealing (250°C) and cooling (250-30°C). The extra accent was focused on the study of melting and solidification process, clearing up formation, distribution and the order of crystallization of the crystal phases (β-Sn, intermetallic compounds) in the selected solder alloys.
Keywords :
"Temperature measurement","X-ray diffraction","Diffraction","Soldering","Cooling","Lead"
Conference_Titel :
Electronics Technology (ISSE), 2011 34th International Spring Seminar on
Print_ISBN :
978-1-4577-2111-3
Electronic_ISBN :
2161-2536
DOI :
10.1109/ISSE.2011.6053877
