DocumentCode
3644354
Title
Testing passive UHF tag performance evolution
Author
Daniel G. Kuester;David R. Novotny;Jeffrey R. Guerrieri;Zoya Popović
Author_Institution
U.S. Department of Commerce, National Institute of Standards and Technology, Boulder, CO, USA 80304
fYear
2011
Firstpage
554
Lastpage
560
Abstract
Trends in tag development since the introduction of the ISO 18000-6C and EPC Global standards are investigated empirically with measurements of power harvesting and backscattering performance from 20 samples of passive tags across 860-960 MHz. The population spans ages of 0 to 6 years, 9 tag manufacturers, and 3 chip manufacturers. All tags were still in working condition, except two 5-year-old tags that no longer responded to interrogations and a 3-year-old tag with a degraded chip-to-antenna bond. Despite steadily improving chips, some older tags show performance comparable to new tags.
Keywords
"Antenna measurements","Power measurement","Backscatter","Modulation","ISO standards","Receiving antennas"
Publisher
ieee
Conference_Titel
RFID-Technologies and Applications (RFID-TA), 2011 IEEE International Conference on
Print_ISBN
978-1-4577-0028-6
Type
conf
DOI
10.1109/RFID-TA.2011.6068600
Filename
6068600
Link To Document