Fault Diagnosis in Memory BIST Environment with Non-march Tests

This paper presents a new BIST-based fault diagnosis scheme for non-march tests of complexity O(n²). It can be used to identify failures in embedded memory arrays using galloping pattern tests. The proposed solution employs scalable and flexible logic to record test responses, with no negative impact on at-speed test. It enables recording of responses produced by failures hard to handle by conventional march tests. This, in turn, allows accurate isolation of memory failures during off-line processing.