DocumentCode :
3647002
Title :
Mechanical characterization of MEMS materials
Author :
Z. Stanimirović;I. Stanimirović
Author_Institution :
IRITEL A.D. Belgrade, Batajnič
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
177
Lastpage :
179
Abstract :
The measurement of MEMS materials mechanical properties is crucial for the design and evaluation of MEMS devices. It is essential both from the aspect of MEMS device performances, as well as from the reliability aspect. This paper provides a brief overview of commonly used test methods for MEMS materials along with measured material data for MEMS structural materials.
Keywords :
"Micromechanical devices","Young´s modulus","Diamond-like carbon","Force","Reliability"
Publisher :
ieee
Conference_Titel :
Microelectronics (MIEL), 2012 28th International Conference on
ISSN :
pending
Print_ISBN :
978-1-4673-0237-1
Type :
conf
DOI :
10.1109/MIEL.2012.6222827
Filename :
6222827
Link To Document :
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