Title :
2012 IRPS panel sessions and workshops [two abstracts]
fDate :
4/1/2012 12:00:00 AM
Abstract :
Provides abstracts for the following panels: "System Approach to Reliability" and "GaN Power Device Reliability - Opportunities and Challenges." A full record of the panel discussions was not made available for publication as part of the conference proceedings.
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1938-1891
DOI :
10.1109/IRPS.2012.6241765
