• DocumentCode
    3647962
  • Title

    Terahertz detection and coherent imaging from 0.2 to 4.3 THz with silicon CMOS field-effect transistors

  • Author

    Alvydas Lisauskas;Sebastian Boppel;Dalius Seliuta;Linas Minkevicius;Irmantas Kašalynas;Gintaras Valušis;Viktor Krozer;Hartmut G. Roskos

  • Author_Institution
    Physikalisches Institut, Goethe-Universitä
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We summarize several lines of investigation of foundry-processed patch-antenna-coupled Si MOSFETs as plasmonic detectors of THz radiation. First, we explore detection at frequencies as high as 4.3 THz, about one hundred times higher than the transit-time-limited cut-off frequency of the devices, searching for the fundamental limits of the detection principle. Then, we address the much-debated issue of enhanced sensitivity by a current bias and conclude that - because of the increased noise - there is no net gain in signal-to-noise ratio. Finally, we simulate operation of a 100×100-pixel heterodyne camera, working with a few detectors of a focal-plane array and quasi-optical coupling of the local-oscillator radiation, and show that real-time operation of a camera should be possible with a dynamic range of 30 dB for a quarter-milliwatt local-oscillator power.
  • Keywords
    "Detectors","Imaging","Transistors","Noise","Silicon","Sensitivity","Frequency measurement"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-1085-7
  • Type

    conf

  • DOI
    10.1109/MWSYM.2012.6259599
  • Filename
    6259599