• DocumentCode
    3648182
  • Title

    Fabrication and characterization of p-NiO/n-ZnO heterojunction towards transparent diode

  • Author

    J. Grochowski;M. Guziewicz;R. Kruszka;M. Borysiewicz;K. Kopałko;A. Piotrowska

  • Author_Institution
    Institute of Electron Technology, Warsaw, Poland
  • fYear
    2012
  • fDate
    5/1/2012 12:00:00 AM
  • Firstpage
    488
  • Lastpage
    491
  • Abstract
    The aim of our work was to produce p-n heterojunction with the high level of optical transmission. P-type NiO and n-type ZnO:Al films deposited by magnetron sputtering were used to fabricate p-n diodes. These were thermally processed in Ar ambient at 400°C in order to obtain high optical transmission and better electrical characteristics. The best diode´s parameters were rectifying ratio of 6.7·104 and reverse current at the level of 6·10-7A at -3 V of bias. The best obtained optical transmission of the bilayer was near 20% in the visual wavelength region.
  • Keywords
    "Zinc oxide","Optical device fabrication","Optical films","Heterojunctions","Argon","Semiconductor diodes"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2012 35th International Spring Seminar on
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4673-2241-6
  • Electronic_ISBN
    2161-2536
  • Type

    conf

  • DOI
    10.1109/ISSE.2012.6273152
  • Filename
    6273152