DocumentCode
3648988
Title
SiGe BiCMOS Technologies for Applications above 100 GHz
Author
H. Rücker;B. Heinemann;A. Fox
Author_Institution
IHP, Frankfurt (Oder), Germany
fYear
2012
Firstpage
1
Lastpage
4
Abstract
This paper describes recent advances in SiGe HBT technology. Technological developments introduced for improved radio-frequency performance are discussed. HBT device characteristics are presented for a 0.13 μm SiGe BiCMOS technology with fT/fmax of 300/500 GHz and mini-mum CML ring oscillator gate delays of 2.0 ps. Sample circuit applications for operating frequencies above 100 GHz are discussed.
Keywords
"Silicon germanium","Heterojunction bipolar transistors","BiCMOS integrated circuits","Current density","Gain","Logic gates","Delay"
Publisher
ieee
Conference_Titel
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE
ISSN
1550-8781
Print_ISBN
978-1-4673-0928-8
Type
conf
DOI
10.1109/CSICS.2012.6340061
Filename
6340061
Link To Document