Title :
Radiation Effect Characterization on the QorIQ P2010 Microprocessor
Author :
Damien Lambert;Xavier Vega;David Gauthier;Bruno Azaïs
Author_Institution :
Nucletudes, Courtaboeuf, France
fDate :
7/1/2012 12:00:00 AM
Abstract :
Upset susceptibilities are measured for the QorIQ P2010 Microprocessor. SEE cross-sections for protons (3.5 to 105 MeV) and heavy ions have been tested for registers and caches. Main characteristics of susceptibility are given.
Keywords :
"Microprocessors","Registers","Protons","Random access memory","Radiation effects","Cache memory","Ionization"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353712
