Title :
Application of time-to-failure distributions for the modelling of ageing processes
Author_Institution :
Rzeszow Univ. of Technology, Dept. of Power Electronic and Power Engineering, Poland
Abstract :
Ageing process of an insulation system appears in the final part of failure rate function v. exploitation time and it influences then the reliability of the device in this time interval of exploitation. Paper presents the different types of the time-to-failure distribution functions and their effects on the failure rate functions.
Keywords :
"Reliability","Aging","Shape","Distribution functions","Weibull distribution","Cable insulation"
Conference_Titel :
High Voltage Engineering and Application (ICHVE), 2012 International Conference on
Print_ISBN :
978-1-4673-4747-1
DOI :
10.1109/ICHVE.2012.6357089
