DocumentCode
3649547
Title
The Influence of Implementation Technology on Dependability Parameters
Author
Jan Schmidt;Petr Fier;Jirí Balcárek
Author_Institution
Dept. of Digital Design, Czech Tech. Univ. in Prague, Prague, Czech Republic
fYear
2012
Firstpage
368
Lastpage
373
Abstract
Circuits which are designed to be dependable are evaluated after gate-level design. To demonstrate the influence of implementation technology on dependability parameters, we developed a simple method which transforms the evaluation problem into conceptual hardware and then to SAT instances and can accommodate any combinational fault model. The performed evaluation demonstrated that the dependability parameters of the implementations correlate to a significant degree.
Keywords
"Circuit faults","Automatic test pattern generation","Vectors","Hardware","Computer architecture","Logic gates","Redundancy"
Publisher
ieee
Conference_Titel
Digital System Design (DSD), 2012 15th Euromicro Conference on
Print_ISBN
978-1-4673-2498-4
Type
conf
DOI
10.1109/DSD.2012.128
Filename
6386912
Link To Document