Title :
MOVES-a method for monitoring and verifying the reliability screening
Author :
M. Bazu;M. Dragan;L. Dragan;A. Stoica
Author_Institution :
Nat. Res. & Dev. Inst. for Microtechnol., Bucharest Univ., Romania
Abstract :
Screening is intended to improve the lot reliability by removing the "weak" components. Till now, only the failed items were withdrawn. In this paper, an original method for identifying the components with low reliability by taking into account the electrical parameter drift is presented. The method, called MOVES, is effective in removing the components surviving after the screening program, but susceptible to fail in a near future (early failures). MOVES contains five procedures, namely VERDECT, LODRIFT, DISCRIM, POSE and INDRIFT. These procedures are detailed and used for some case studies.
Keywords :
"Nondestructive testing","Condition monitoring","Failure analysis","Performance evaluation","Research and development","Mathematics","Manufacturing","Flowcharts","Electric shock","Position measurement"
Conference_Titel :
Semiconductor Conference, 1997. CAS ´97 Proceedings., 1997 International
Print_ISBN :
0-7803-3804-9
DOI :
10.1109/SMICND.1997.651025