DocumentCode
3650394
Title
Junction field-effect transistor based on GaAs core-shell nanowires
Author
O. Benner;A. Lysov;C. Gutsche;G. Keller;C. Schmidt;W. Prost;F. J. Tegude
Author_Institution
Solid State Electronics Department, University Duisburg-Essen, Germany
fYear
2013
Firstpage
1
Lastpage
2
Abstract
Nanowire FETs with all-around Junction-Gate are demonstrated using GaAs core-shell nanowires. The electrical properties of the n-channel Junction FET were determined by DC measurements. The radial pn-junctions show diode-type I-V characteristics. The output and transfer I-V characteristics exhibit good pinch-off, and hysteresis-free transient behavior. First devices with 190 nm nanowire channel diameter show a drain current of ID = 260 nA and a transconductance of gm = 300 nS.
Keywords
"Nanowires","Gallium arsenide","Transistors","Logic gates","Current measurement","Dielectrics","Junctions"
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
ISSN
1092-8669
Print_ISBN
978-1-4673-6130-9
Type
conf
DOI
10.1109/ICIPRM.2013.6562589
Filename
6562589
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